The observation of materials structure – from the nanometric to the micrometric scale – is essential for a better understanding of the physical properties (property/structure relationship) as well as for the development of new efficient materials. The objective of this cours is to introduce the structural characterization instrumentation typically used in research labs as well as on large instruments. The complementarity aspect of scattering and microscopy methods will be introduction at the beginning of the course. The course will address the production of X-ray and neutron radiation, interaction with matter, diffraction by crystals, then small-angle scattering for the investigation of polymer materials.

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